Radiation hardening

BIRAD - Research and Development Co. Ltd

Cutting-Edge Complementary Dual Modular Redundancy Memory Cell

By Nati Fisher / December 18, 2020 / Comments Off on Cutting-Edge Complementary Dual Modular Redundancy Memory Cell

Embedded memories are often operated at scaled supply voltages in order to reduce their power consumption. However, reduction in the supply voltage also increases their susceptibility to soft errors. Soft errors occur when an energetic particle hits a reversed bias junction of an internal node in a memory cell, possibly flipping the data stored in…

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